Análisis electromagnético mediante FDTD de un sustrato para etiquetas RFID pasivas
DOI:
https://doi.org/10.29105/cienciauanl23.103-3Palabras clave:
etiqueta RFID, interferencia electromagnética, ley de Snell, FDTDResumen
La tecnología RFID, la cual permite el reconocimiento de objetos y transmisión de datos mediante señales de radiofrecuencia, presenta un desempeño que depende del material del producto al que son adheridas, por ello para su funcionamiento óptimo en cualquier producto es necesario diseñar un sustrato para la etiqueta RFID que evite la IEM. Se presenta un análisis en un sustrato para etiquetas RFID mediante el método FDTD, el cual demuestra que con el uso del sustrato se reflejan las OEM hacia la etiqueta RFID, aislando la etiqueta del producto al cual se adhiere y con esto evitar la IEM.
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